Description
Memory corruption may occour while generating test pattern due to negative indexing of display ID.
Metrics
CVSS 3.1 7.8/10
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:HWeakness enumeration
Affected software
| Vendor | Product | Versions |
|---|---|---|
| Qualcomm, Inc. | Snapdragon | FastConnect 6700; FastConnect 6900; FastConnect 7800; QCM5430; QCM6490; QCS5430; QCS6490; Qualcomm Video Collaboration VC3 Platform; SC8380XP; SDM429W; Snapdragon 429 Mobile Platform; Snapdragon 7c+ Gen 3 Compute; Snapdragon 8cx Gen 3 Compute Platform (SC8280XP-AB, BB); WCD9370; WCD9375; WCD9380; WCD9385; WCN3620; WCN3660B; WSA8830 |
References
Timeline
- Published
- Feb 3, 2025
- Last modified
- Jun 17, 2026
- NVD status
- Analyzed